We were delighted to present our latest research at the SPIE Sensors + Imaging conference in Edinburgh last week, titled “Voltage Domain TDI with Diffusion Enhanced Pixels.”
Presented by Ben De Brabanter, the paper demonstrates an analogue voltage domain implementation of a Time Delay and Integration (TDI) sensor using CMOS technology. Designed for ‘push-broom’ operation in a remote sensing mission, the large pixels feature a unique ‘sun-shape’ geometry that reduces photo charge diffusion time to the central transfer gate by an estimated factor of four.
At Caeleste, we specialise in developing custom image sensors tailored to specific applications and project requirements across diverse fields, including the medical, industrial, and aerospace sectors. Contact us to discuss your project needs and get started! 🛰🚀🔬