On November 16th and 17th, the French space agency CNES, together with ESA, ISAE, Airbus D&S, Thales-Alenia Space and Sodern, is organizing a prestigious workshop on high-performance image sensors and radiation effects. The first day (16/11) will be devoted to “Radiation effects on opto-electronic detectors”, while the second day (17/11) will focus on “Photon counting, low flux and high dynamic range opto-electronic detectors”. More than 300 specialists from Europe and beyond, will discuss recent results and future trends for image sensors in space missions. Caeleste will contribute with 2 papers. On the first day Caeleste will present its radiation hardened design data base as well as the effects of radiation on image sensors realized in that technology. We will focus especially on the differences in behavior between ionizing and non-ionizing radiation.
The blue dots and circles show the effect of ionizing radiation on dark signal, while the red dots and circles are the effects of non-ionizing radiation (electrons in this case). The difference in behavior between the photodiode itself and the sense node will also be explained.
On the second day Caeleste will present its new, patented technique to combine the best of both worlds:
Photon counting under low-flux conditions.
Integrating charge packet detection under high flux conditions.
In this way a photon shot noise behavior can be guaranteed from the first detected photon till the last photon before full well. The circuit on the right shows the combination of a pulse shaper for the single photon detection, combined with a current integrator for higher flux conditions.